/* SPDX-License-Identifier: GPL-2.0 */#ifndef _KUNIT_OF_H#define _KUNIT_OF_H #include <kunit/test.h> struct device_node; #ifdef CONFIG_OF void of_node_put_kunit(struct kunit *test, struct device_node *node); #else static inlinevoid of_node_put_kunit(struct kunit *test, struct device_node *node){	kunit_skip(test, "requires CONFIG_OF");} #endif /* !CONFIG_OF */ #if defined(CONFIG_OF) && defined(CONFIG_OF_OVERLAY) && defined(CONFIG_OF_EARLY_FLATTREE) int of_overlay_fdt_apply_kunit(struct kunit *test, void *overlay_fdt,			       u32 overlay_fdt_size, int *ovcs_id);#else static inline intof_overlay_fdt_apply_kunit(struct kunit *test, void *overlay_fdt,			   u32 overlay_fdt_size, int *ovcs_id){	kunit_skip(test, "requires CONFIG_OF and CONFIG_OF_OVERLAY and CONFIG_OF_EARLY_FLATTREE for root node");	return -EINVAL;} #endif /** * __of_overlay_apply_kunit() - Test managed of_overlay_fdt_apply() variant * @test: test context * @overlay_begin: start address of overlay to apply * @overlay_end: end address of overlay to apply * * This is mostly internal API. See of_overlay_apply_kunit() for the wrapper * that makes this easier to use. * * Similar to of_overlay_fdt_apply(), except the overlay is managed by the test * case and is automatically removed with of_overlay_remove() after the test * case concludes. * * Return: 0 on success, negative errno on failure */static inline int __of_overlay_apply_kunit(struct kunit *test,					   u8 *overlay_begin,					   const u8 *overlay_end){	int unused; 	return of_overlay_fdt_apply_kunit(test, overlay_begin,					  overlay_end - overlay_begin,					  &unused);} #define of_overlay_begin(overlay_name) __dtbo_##overlay_name##_begin#define of_overlay_end(overlay_name) __dtbo_##overlay_name##_end #define OF_OVERLAY_DECLARE(overlay_name)			\	extern uint8_t of_overlay_begin(overlay_name)[];	\	extern uint8_t of_overlay_end(overlay_name)[]		\ /** * of_overlay_apply_kunit() - Test managed of_overlay_fdt_apply() for built-in overlays * @test: test context * @overlay_name: name of overlay to apply * * This macro is used to apply a device tree overlay built with the * cmd_dt_S_dtbo rule in scripts/Makefile.lib that has been compiled into the * kernel image or KUnit test module. The overlay is automatically removed when * the test is finished. * * Unit tests that need device tree nodes should compile an overlay file with * @overlay_name\.dtbo.o in their Makefile along with their unit test and then * load the overlay during their test. The @overlay_name matches the filename * of the overlay without the dtbo filename extension. If CONFIG_OF_OVERLAY is * not enabled, the @test will be skipped. * * In the Makefile * * .. code-block:: none * *	obj-$(CONFIG_OF_OVERLAY_KUNIT_TEST) += overlay_test.o kunit_overlay_test.dtbo.o * * In the test * * .. code-block:: c * *	static void of_overlay_kunit_of_overlay_apply(struct kunit *test) *	{ *		struct device_node *np; * *		KUNIT_ASSERT_EQ(test, 0, *				of_overlay_apply_kunit(test, kunit_overlay_test)); * *		np = of_find_node_by_name(NULL, "test-kunit"); *		KUNIT_EXPECT_NOT_ERR_OR_NULL(test, np); *		of_node_put(np); *	} * * Return: 0 on success, negative errno on failure. */#define of_overlay_apply_kunit(test, overlay_name)		\({								\	OF_OVERLAY_DECLARE(overlay_name);			\								\	__of_overlay_apply_kunit((test),			\			of_overlay_begin(overlay_name),		\			of_overlay_end(overlay_name));		\}) #endif